| 发明名称 |
Analog and mixed signal device tester |
| 摘要 |
Analog and mixed signal integrated circuits are tested using the modified Volterra series to model the integrated circuit being tested. An adaptive algorithm, for example, least mean square or Kalman, is used to determine to coefficients of the Volterra series. The coefficients are then used to calculate the THD and SNR.
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| 申请公布号 |
US5744969(A) |
申请公布日期 |
1998.04.28 |
| 申请号 |
US19950581283 |
申请日期 |
1995.12.29 |
| 申请人 |
LUCENT TECHNOLOGIES INC. |
发明人 |
GROCHOWSKI, ANDREW;HSIEH, SHWU-LIANG LUKE |
| 分类号 |
G01R23/20;G01R29/26;G01R31/3167;(IPC1-7):G01R20/26 |
主分类号 |
G01R23/20 |
| 代理机构 |
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