Method of and apparatus for automatic handling of test pieces

摘要

The present invention relates to a method of and an apparatus for handling test pieces in which a stack of test pieces is formed on a lift table of the apparatus and are brought into a predetermined position by a slide, which displaces the test pieces horizontally against a guide bead, with the test pieces being lifted-off the stack and transported to a test position by a first transporter having replaceable test piece-specific holding and positioning elements, and with the test pieces being transported from the test position to a storing position by a second transported having replaceable test piece-specific holding elements.