发明名称 Method of, and apparatus for, dry etching.
摘要 <p>This invention provides a method of dry etching and an apparatus for use with such method capable of producing a multi-layered structure having substantially a flat etched wall and high selectivity. There is provided a method of dry etching that disposing an object having a first film and second film thereon in a vacuum chamber, introducing an activated reacted gas, and cooling the object to less than a temperature which causes a film to be deposited including at least an element of the first film material on the first film.</p>
申请公布号 EP0297898(A2) 申请公布日期 1989.01.04
申请号 EP19880306008 申请日期 1988.07.01
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 ARIKADO, TSUNETOSHI C/O PATENT DIVISION;HORIKE, YASUHIRO C/O PATENT DIVISION;SEKINE, MAKOTO C/O PATENT DIVISION;OKANO, HARUO C/O PATENT DIVISION
分类号 H01L21/311;H01L21/3213 主分类号 H01L21/311
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