发明名称 |
Method of, and apparatus for, dry etching. |
摘要 |
<p>This invention provides a method of dry etching and an apparatus for use with such method capable of producing a multi-layered structure having substantially a flat etched wall and high selectivity. There is provided a method of dry etching that disposing an object having a first film and second film thereon in a vacuum chamber, introducing an activated reacted gas, and cooling the object to less than a temperature which causes a film to be deposited including at least an element of the first film material on the first film.</p> |
申请公布号 |
EP0297898(A2) |
申请公布日期 |
1989.01.04 |
申请号 |
EP19880306008 |
申请日期 |
1988.07.01 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
ARIKADO, TSUNETOSHI C/O PATENT DIVISION;HORIKE, YASUHIRO C/O PATENT DIVISION;SEKINE, MAKOTO C/O PATENT DIVISION;OKANO, HARUO C/O PATENT DIVISION |
分类号 |
H01L21/311;H01L21/3213 |
主分类号 |
H01L21/311 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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