| 摘要 |
<p>PROBLEM TO BE SOLVED: To reduce the possibility that a contact defect of a probe is caused at the time of display inspection by short-circuiting source signal lines by using other source short-circuit lines by the colors of the source signal lines. SOLUTION: All the source signal lines 3 are short-circuited to one another by using the source short-circuit lines 6, and all gate signal lines 2 are short- circuited to one another by using a gate short-circuit line 7. Here, the source signal lines 3 are short-circuited by using the source short-circuit lines 6 by the colors of the source signal lines 3. Namely, the source signal lines 3 are connected to the three source short-circuit lines 6 by the colors. All the gate signal lines 2, on the other hand, are connected to the gate short-circuit line 7 through a gate signal line terminal 1. Thus, all the source signal lines 3 are connected to the three source short-circuit lines 6 by the colors, so the probability that a contact defect of the probe is caused at the time of display inspection can be reduced.</p> |
