发明名称 MANUFACTURE OF POLYSILICON ELECTRODE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method for an HSG(Hemispherical grain)- polysilicon electrode which prevents incomplete formation of HSG due to impurities attached to an amorphous silicon pattern, and to form a capacitor electrode with increased effective area in a stable manner. SOLUTION: The HSG-polysilicon electrode is manufactured by forming an amorphous silicon pattern 120 on a semiconductor substrate 100, forming an HSG core, and performing heat processing. During a period between the formation of the amorphous silicon pattern and the formation of the HSG core, the surface of the amorphous silicon pattern is covered with a sacrificial film 130.
申请公布号 JPH10107228(A) 申请公布日期 1998.04.24
申请号 JP19970250181 申请日期 1997.09.16
申请人 SAMSUNG ELECTRON CO LTD 发明人 KIN EIZEN;BOKU EIKYOKU;NAN SHOKI
分类号 H01L21/28;H01L21/3205;H01L21/8242;H01L23/52;H01L27/108 主分类号 H01L21/28
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