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发明名称
PROBE CARD FOR TESTING IC
摘要
申请公布号
JPH10107101(A)
申请公布日期
1998.04.24
申请号
JP19960278908
申请日期
1996.09.30
申请人
YAMAHA CORP
发明人
ONO YUKICHI
分类号
G01R1/073;H01L21/66;(IPC1-7):H01L21/66
主分类号
G01R1/073
代理机构
代理人
主权项
地址
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