发明名称 ELECTRODE STRUCTURE AND ITS MANUFACTURING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a structure of an electrode on a substrate with an insulating film in between, and its manufacturing method, in which a deterioration in characteristics of an gate insulating film generating in plasma etching can be prevented. SOLUTION: At least an active region 6 other than an active region 2 that is separated by an element separation region 4 is treated in doping of conductive-type other than the type of a substrate 100 to form an ohmic contact region 8, and thereby an electrode 14 formed in the active region 2 is made in contact with the ohmic contact region 8. In this way the ohmic contact region 8 of conductive-type other than the substrate 100 is formed independently from the active region 2. and the electrode has a structure, in which the ohmic contact region 14 is elongated and put in contact with the ohmic contact region 8.</p>
申请公布号 JPH10106970(A) 申请公布日期 1998.04.24
申请号 JP19970258348 申请日期 1997.09.24
申请人 SAMSUNG ELECTRON CO LTD 发明人 KIN EIKO;BUN SAIKAN
分类号 H01L21/28;H01L21/3205;H01L23/52;H01L29/78;(IPC1-7):H01L21/28;H01L21/320 主分类号 H01L21/28
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