发明名称 Pattern formation method and surface treatment agent
摘要 <p>A surface of a semiconductor substrate of silicon is supplied with 4-trimethylsiloxy-3-penten-2-one serving as a surface treatment agent. Thus, H in OH groups existing on the surface of the semiconductor substrate is substituted with Si(CH3)3 (i.e., a trimethylsilyl group), resulting in producing CH3COCH2COCH3 (i.e., acetylacetone). Then, the surface of the semiconductor substrate is coated with a resist, exposed by using a desired mask, and subjected successively to PEB and development, thereby forming a resist pattern thereon. Since the surface of the semiconductor substrate is treated with 4-trimethylsiloxy-3-penten-2-one, the surface of the semiconductor substrate is made to be hydrophobic, so that the adhesion of the semiconductor substrate can be improved. As a result, the resultant resist pattern has a satisfactory shape free from peeling. &lt;IMAGE&gt;</p>
申请公布号 EP0837369(A1) 申请公布日期 1998.04.22
申请号 EP19970115726 申请日期 1997.09.10
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.;SHIN-ETSU CHEMICAL CO., LTD. 发明人 ENDO, MASAYUKI;OHSAKI, HIROMI
分类号 G03F7/075;(IPC1-7):G03F7/075 主分类号 G03F7/075
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