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发明名称
MEMORY DEVICE WITH PARALLEL TEST CIRCUIT
摘要
申请公布号
KR0135242(B1)
申请公布日期
1998.04.22
申请号
KR19940017663
申请日期
1994.07.21
申请人
HYUNDAI ELECTRONICS IND. CO.,LTD
发明人
RYU, DOK-HYUN
分类号
H01L27/10;(IPC1-7):H01L27/10
主分类号
H01L27/10
代理机构
代理人
主权项
地址
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