发明名称 STRUCTURE AND MANUFACTURING METHOD OF COMPLEX SEMICONDUCTOR ELEMENT
摘要 The BI-CMOS containing the bipolar and CMOS is fabricated by electrically isolating the both sides of N+-polycrystalline Si acting as the source and drain of CMOS, and the emitter and collector of bipolar. The width of inactive base region is reduced by dry etching the silicon after depositing the nitride film. The inactive base region and all junctions are formed to reduce the serics resistance of base in bipolar transistor by wet etching the nitride films after depositing the base oxide film of CMOS followed by aluminium metallization.
申请公布号 KR910005393(B1) 申请公布日期 1991.07.29
申请号 KR19880010254 申请日期 1988.08.11
申请人 KOREA ELECTRICITY & TELECOMMUNICATION AUTHORITY;KOREA ELECTRONICS & TELECOMMUNICATION RESEARCH INSTITUTE FOUNDATION 发明人 KIM GWANG-SU;CHAE SANG-HUN;KIM YEONG-HWAN;KIM BO-WOO;LEE JIN-HYO
分类号 H01L29/73;H01L21/331;H01L21/8249;H01L27/06;H01L29/70;H01L29/732;(IPC1-7):H01L29/70 主分类号 H01L29/73
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