| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for adjusting a crystal axis orientation of an ingot by utilizing X-ray on the same machine as an X-ray crystal axis orientation measuring apparatus and an apparatus therefor. SOLUTION: A slide table 70 is provided on the same machine as an X-ray crystal axis orientation measuring apparatus 160 and an orientation adjusting mechanism 60 to which an ingot 54 is attached is fixed to the slide table 70. The slide table 70 is moved to a detection position and the crystal axes in the vertical and horizontal directions of the ingot 54 are measured by an X-ray irradiation part 170 and an X-ray light detection part 172. In such a state that the ingot 54 is kept parallel to a wire row by the orientation adjusting mechanism 60, the crystal axis of the ingot 54 is matched with the crystal axis measured by the X-ray crystal orientation measuring apparatus 160. |
