| 摘要 |
This invention is a method for improving the quality of analytical measurement data by eliminating the fluctuation and drift of spectral line intensities obtained by an atomic emission spectrometer or a mass spectrometer. Carrying out this method needs measuring intensities of an analytical line and two reference lines for a sample. This method is involved in the calculation of a sequence of analytical line intensity ratios Ij and a sequence of fluctuation disagreements Fj of intensities between two reference lines, in the use of one of the following three equations Ij=K0+K1Cj+KflCjFjIj=K0+K1Cj+KflCjFj+KT1CjTjIj=K0+K1Cj+KflCjFj+Kt1CjTj+Kt2CjTj2to regress out a relationship among the ratios, fluctuation disagreements, times Tj and concentrations Cj using a sequence of standard samples where K0, K1, Kfl, Kt1 and Kt2 are coefficients to be regressed out, and finally in the prediction of a component concentration for an unknown sample according to one of the above three equations previously used for the regression.
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