| 摘要 |
FIELD: measurement technology. SUBSTANCE: device checking and measuring dielectric parameters of various media has microcomputer that incorporates microprocessor 1, control desk 2, indication unit 3 and interface 15, first digital-to-analog converter 4, analog-to-digital converter 5, SHF generator 6 of sweep-frequency, meter 7 placed into protective case 8 and including two dielectric substrates 9 carrying input 10 and output 11 microstrip transmission lines, meter 12 of phase shift signals, retrieval and storage unit 13, RC integrator 14, pulse former 16, voltage controlled generator 17, second digital-to-analog converter 18. Adjoining internal sides 19 of dielectric substrates 9 are separated by layer 20 of metal resistively coupled to input and output transmission lines. Layers 28 of metal are deposited on opposite external sides 23 of dielectric substrates and sections 26 of microstrip transmission lines arranged in symmetry relative to axis 25 passing through center of width of input and output transmission lines are also located. Layers 28 of metal and sections 26 of microstrip transmission lines on external sides of substrates are resistively coupled in area of projection of resistive coupling of input and output transmission lines and layer of metal on internal sides of substrates. Projections of edges of layers of metal in area of resistive coupling form right angle, length of sections of microstrip transmission lines is $$$, where $$$ is wave length and thickness of substrate is $$$. In another variant of device SHF generator of sweep-frequency and phase shift meter are located in protective case of measurement device. Protective case is tight, it can screen external side of one of dielectric substrates. Reference medium is placed between screening part of protective case and external side of this substrate. EFFECT: improved functional efficiency of device. 1 cl, 4 dwg øøø1
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