Apparatus for the single-axis examination of micro-tension samples

摘要

An apparatus for single-axis examinations of micro samples in a tensile testing machine having opposite pull rods between which the apparatus is mounted for the application of tensile forces to a micro-sample includes a load frame for the connection to the pull rods which load frame comprises two parallel spring frame structures in the form of serially arranged cantilever beams defining multiple S structures interconnecting a bottom and a top frame part, sample mounting means mounted on one of the parts, a force measuring element mounted on the other frame part and including hydraulic sample mounting means and flexible means which bend depending on the pulling force applied thereto and which have tension measuring means to measure the bending extent and means for sensing the movement of the second mounting means relative to the one frame part.