发明名称 Method of manufacturing stacked capacitor type semiconductor memory device
摘要 A semiconductor memory device according to the present invention comprises a memory cell having one transistor and one stacked capacitor. The stacked capacitor is stacked on the surface of a semiconductor substrate. Further, the stacked capacitor has a structure extending on a gate electrode and a word line through an insulating layer. A lower electrode layer of the capacitor had various concave/convex shapes, i.e. step portions and projecting portions formed on the surface thereof. These shapes are made by employing various etching processes. The lower electrode layer has such various concave/convex shapes formed thereon, so that a surface area and capacitance of the capacitor can be increased.
申请公布号 US5180683(A) 申请公布日期 1993.01.19
申请号 US19910727781 申请日期 1991.07.10
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 WAKAMIYA, WATARU;TANAKA, YOSHINORI;EIMORI, TAKAHISA;OZAKI, HIROJI;KIMURA, HIROSHI;SATOH, SHINICHI
分类号 H01L27/108 主分类号 H01L27/108
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