发明名称 CAPACITOR FABRICATION METHOD FOR SEMICONDUCTOR MEMORY
摘要 A fabrication method of capacitor is provided to improve cell capacitance and yield. The method comprises the steps of: forming an etch stopping layer(52), a first insulator(54), a first conductive layer(56) and a second insulator(58) on a substrate(10) having transistor; forming a contact hole by selective etching the second insulator(58), the first conductive layer(56) and the first insulator(54) to expose the source region(16) of the transistor; depositing a second conductive layer(60); defining a storage electrode(100) by unit cell by etching the second conductive layer(60), the second insulator(58) and the first conductive layer(56); and forming a dielectric layer(110) and a plate electrode(120). Thereby, it is possible to increase the cell capacitance using simple processes.
申请公布号 KR0133261(B1) 申请公布日期 1998.04.16
申请号 KR19930032058 申请日期 1993.12.31
申请人 SAMSUNG ELECTRONICS CO.,LTD 发明人 LEE, SOO-CHUN
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
代理机构 代理人
主权项
地址