发明名称 |
BURN-IN METHOD AND APPARATUS OF ECL CIRCUIT |
摘要 |
The semiconductor device includes a circuit, such as, an ECL circuit for comparing input signals with a reference potential determined as a circuit threshold value and outputting an output signal according to the comparison result. The semiconductor device further includes a switching circuit for switching the reference potential level between ordinary operation and burn-in operation of the ECL circuit. The time required for the burn-in operation can be reduced markedly. |
申请公布号 |
KR0132756(B1) |
申请公布日期 |
1998.04.16 |
申请号 |
KR19940004964 |
申请日期 |
1994.03.14 |
申请人 |
TOSHIBA K.K. |
发明人 |
KURODA, DADAHIRO;NOMA, MAGOTO |
分类号 |
G01R31/28;G01R31/30;G01R31/317;G01R31/3173;(IPC1-7):H01L21/66 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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