发明名称 |
METHOD FOR INSPECTING AN INTEGRATED CIRCUIT |
摘要 |
The method for inspecting an integrated circuit comprising a plurality of sub-circuits includes the determination of the supply current into at least one of the sub-circuits. This supply current is determined, while the other sub-circuits are operational, by measuring the voltage over a segment of the supply line through which this supply current flows. This supply line contains no additional components to facilitate the measuring of the voltage.
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申请公布号 |
WO9815844(A1) |
申请公布日期 |
1998.04.16 |
申请号 |
WO1997IB01056 |
申请日期 |
1997.09.03 |
申请人 |
PHILIPS ELECTRONICS N.V.;PHILIPS NORDEN AB |
发明人 |
VAN LAMMEREN, JOHANNES, PETRUS, MARIA;ZWEMSTRA, TACO |
分类号 |
G01R31/26;G01R31/28;G01R31/30;G01R31/316;G01R31/317;(IPC1-7):G01R31/38 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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