COLUMN REDUNDANCY CIRCUIT OF SEMICONDUCTOR DEVICE

摘要

The present invention relates to a column redundancy apparatus of a seminconductor element capable of selecting a row address maintaining in a don't care state and substituting with a column address for a data input and output by an increased refresh rate by using a metal or bonding option in a column redundancy apparatus in order to prevent a column repair efficacy from being reduced according to an increasement of a refresh rate. In the apparatus, a defect bit line select address is applied to programmable column repair fuse box. An address a select function of which is lost due to an increasement of a refresh rate among addresses which are used to divide a plurality of small cell array blocks is substituted with the defect bit line address when a refresh rate is increased.