| 摘要 |
PCT No. PCT/EP91/01294 Sec. 371 Date Mar. 9, 1992 Sec. 102(e) Date Mar. 9, 1992 PCT Filed Jul. 9, 1991 PCT Pub. No. WO92/01233 PCT Pub. Date Jan. 23, 1992.A method for measuring the resistance or conductivity between two or more conductors which are placed against a semiconductor element, wherein in order to bring the contact resistance between the conductors and the element to, to hold it at,a predetermined value during measuring, the conductors are held at a constant distance and/or under constant pressure relative to the semiconductor element.
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