发明名称 PREPARATION OF ABNORMALITY DIAGNOSTIC REFERENCE PATTERN FOR AUTOMATION EQUIPMENT SYSTEM AND AUTOMATIC DIAGNOSTIC DEVICE USING THE REFERENCE PATTERN
摘要 <p>PROBLEM TO BE SOLVED: To automatically, quickly and accurately prepare a reference pattern in an automation equipment system and also to change and correct the reference pattern. SOLUTION: In this method, a reference pattern is prepared for the diagnosis of abnormality in an automation equipment system which is operated by sequencer. The internal contact of the sequencer, the control contact of the system and the state changes of sequence elements of a sensor, etc., are read in time series every time the sequencer executes a prescribed sequence program and then recorded as the sequence state change information. Then the sequence elements Y10 and Y11 having the fixed regularity are extracted from the recorded sequence state change information with respect to the operation of a specific sequence element X1. The change information on the elements Y10 and Y11 which are extracted for every element X1 are collected, so that the diagnostic reference pattern is automatically prepared.</p>
申请公布号 JPH1097318(A) 申请公布日期 1998.04.14
申请号 JP19960250147 申请日期 1996.09.20
申请人 MATSUSHITA ELECTRIC WORKS LTD 发明人 FUCHIDA FUTOSHI;TSUJI ATSUSHI
分类号 G05B19/05;G05B23/02;(IPC1-7):G05B23/02 主分类号 G05B19/05
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