发明名称 |
MULTILAYER-FORM METAL COATING SYSTEM OF SILICON SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: To form a stable low-resistance electrical contact on silicon by successively forming amorphous tungsten and silicon on a layer that is made of titanium and metal silicide on the surface of a contact region in a silicon substrate and a layer that is made of aluminum and aluminum alloy on it. CONSTITUTION: A three-layer metal covering pattern is arranged on a silicon oxide covering 20. The metal covering pattern is partially in contact with a silicon surface part 12' being exposed in a gap 22. The second part is in contact with the silicon surface part 12' being exposed in a gap 24. The three-layer metal covering pattern contains a first layer or a lower layer 26 made of titanium. Amorphous tungsten and silicon, second layer or an intermediate layer 28 is arranged on the titanium layer 26. A thick layer 30 made of aluminum alloy is arranged on the amorphous tungsten and silicon layer 28. The titanium layer 26 forms a low-resistance contact for both of silicon and amorphous tungsten and the silicon layer. |
申请公布号 |
JPH0799303(A) |
申请公布日期 |
1995.04.11 |
申请号 |
JP19940129228 |
申请日期 |
1994.06.10 |
申请人 |
DELCO ELECTRON CORP |
发明人 |
ROBAATO JIEEMUZU HEIDOMAN;RANDEII ARAN RATSUSHIYU;MAIKERU SUKOTSUTO BEAADO |
分类号 |
H01L29/43;H01L21/28;H01L23/532;H01L29/45;H01L29/47;H01L29/861;H01L29/872;(IPC1-7):H01L29/43 |
主分类号 |
H01L29/43 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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