发明名称 Method and apparatus for identifying and correcting date calculation errors caused by truncated year values
摘要 A standardized test environment assists identifying problematic instances of instructions in computer programs that produce erroneous results caused by dates having years expressed in a truncated form. A standardized production environment takes corrective action for specified instances of instructions by modifying one or more values such that the instructions achieve correct results. In one embodiment of a test environment, a computer system collects diagnostic information for instances of subtraction operations that produce negative results. In one embodiment of a production environment, a computer system intercepts execution of a computer program at specified locations and takes corrective action according to information obtained from a table of control information.
申请公布号 US5740442(A) 申请公布日期 1998.04.14
申请号 US19960704225 申请日期 1996.08.27
申请人 HITACHI DATA SYSTEMS CORPORATION 发明人 COX, WILLIAM GARY;DEMARAY, MILTON WAYNE
分类号 G06F11/28;G06F9/06;G06F9/44;G06F11/36;G06F17/10;(IPC1-7):G06F9/44 主分类号 G06F11/28
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