发明名称 |
Method and apparatus for identifying and correcting date calculation errors caused by truncated year values |
摘要 |
A standardized test environment assists identifying problematic instances of instructions in computer programs that produce erroneous results caused by dates having years expressed in a truncated form. A standardized production environment takes corrective action for specified instances of instructions by modifying one or more values such that the instructions achieve correct results. In one embodiment of a test environment, a computer system collects diagnostic information for instances of subtraction operations that produce negative results. In one embodiment of a production environment, a computer system intercepts execution of a computer program at specified locations and takes corrective action according to information obtained from a table of control information.
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申请公布号 |
US5740442(A) |
申请公布日期 |
1998.04.14 |
申请号 |
US19960704225 |
申请日期 |
1996.08.27 |
申请人 |
HITACHI DATA SYSTEMS CORPORATION |
发明人 |
COX, WILLIAM GARY;DEMARAY, MILTON WAYNE |
分类号 |
G06F11/28;G06F9/06;G06F9/44;G06F11/36;G06F17/10;(IPC1-7):G06F9/44 |
主分类号 |
G06F11/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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