发明名称 METHOD FOR MANUFACTURING FIELD EFFECT TRANSISTOR
摘要 A fabrication method of FET(Field Effect Transistor) having a T-shaped gate metal electrode is provided to simplify the process and minimize a length of electrode. The method comprises the steps of: sequentially forming a first insulating layer(2) and a PR pattern(3) on a substrate(1); depositing a second insulating layer(5) on the entire surface of the resultant structure; forming a sidewall(6) at the side of the PR pattern(3) by anisotropic etching the second insulating layer(5); etching the first insulating layer(2) using the sidewall(6) as a mask; removing the sidewall(6); depositing a gate metal on the entire surface of the resultant structure; and forming a T-shaped gate metal electrode(7) by lift-off the PR pattern(3)
申请公布号 KR0130963(B1) 申请公布日期 1998.04.14
申请号 KR19920009915 申请日期 1992.06.09
申请人 LG ELECTRONICS CO.,LTD 发明人 SHIN, JIN-HO;KWON, YOUNG-SE;KIM, CHANG-TAE
分类号 H01L21/205;H01L21/027;H01L21/033;H01L21/285;H01L21/338;H01L29/812;(IPC1-7):H01L29/78 主分类号 H01L21/205
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