发明名称 |
METHOD FOR MANUFACTURING FIELD EFFECT TRANSISTOR |
摘要 |
A fabrication method of FET(Field Effect Transistor) having a T-shaped gate metal electrode is provided to simplify the process and minimize a length of electrode. The method comprises the steps of: sequentially forming a first insulating layer(2) and a PR pattern(3) on a substrate(1); depositing a second insulating layer(5) on the entire surface of the resultant structure; forming a sidewall(6) at the side of the PR pattern(3) by anisotropic etching the second insulating layer(5); etching the first insulating layer(2) using the sidewall(6) as a mask; removing the sidewall(6); depositing a gate metal on the entire surface of the resultant structure; and forming a T-shaped gate metal electrode(7) by lift-off the PR pattern(3)
|
申请公布号 |
KR0130963(B1) |
申请公布日期 |
1998.04.14 |
申请号 |
KR19920009915 |
申请日期 |
1992.06.09 |
申请人 |
LG ELECTRONICS CO.,LTD |
发明人 |
SHIN, JIN-HO;KWON, YOUNG-SE;KIM, CHANG-TAE |
分类号 |
H01L21/205;H01L21/027;H01L21/033;H01L21/285;H01L21/338;H01L29/812;(IPC1-7):H01L29/78 |
主分类号 |
H01L21/205 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|