发明名称 |
Position measuring system |
摘要 |
A position measuring system having an illuminating device for generating a beam of light. A graduation support is provided with a graduation and a reference marker with a first set of graduation markings, where the graduation support receives the beam of light and generates a second beam of light. A scanning plate moves along a measuring direction and receives the second beam of light and generates a third beam of light, wherein the scanning plate has a second set of graduation markings for scanning the first set of graduation markings of the reference marker. A first photodetector and a second photodetector receive portions of the third beam of light and generate position-dependent electrical signals, wherein either the first set of graduation markings of the reference marker or the second set of graduation markings have a structure which deflects in the measuring direction.
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申请公布号 |
US5739911(A) |
申请公布日期 |
1998.04.14 |
申请号 |
US19960679201 |
申请日期 |
1996.07.12 |
申请人 |
DR. JOHANNES HEIDENHAIN GMBH |
发明人 |
HOLZAPFEL, WOLFGANG;HUBER, WALTER |
分类号 |
G01B11/00;G01B21/02;G01D5/38;(IPC1-7):G01B11/00 |
主分类号 |
G01B11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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