发明名称 PHASE SHIFT MASK AND FABRICATION METHOD THEREOF
摘要 A phase shift mask and method thereof is provided to prevent formation of unnecessary patterns. The method comprises the steps of: forming bar-shaped chrome patterns(1) having a spaced distance on a quartz substrate(10); forming a phase shifting pattern(2) such as SOG(spin on glass) or SiO2 on a portion of the chrome patterns(1); and forming a photoresist pattern(20a) used as phase shifting layer the range of 0 -108 degrees at back-side of edge of the phase shifting pattern(2) by exposing and developing a positive photoresist(20) using as the phase shifting pattern(2) and the chrome pattern(1) as a mask.
申请公布号 KR0131750(B1) 申请公布日期 1998.04.14
申请号 KR19930019984 申请日期 1993.09.28
申请人 HYUNDAI ELECTRONICS IND. CO.,LTD 发明人 HAM, YOUNG-MOK
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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