发明名称 |
PHASE SHIFT MASK AND FABRICATION METHOD THEREOF |
摘要 |
A phase shift mask and method thereof is provided to prevent formation of unnecessary patterns. The method comprises the steps of: forming bar-shaped chrome patterns(1) having a spaced distance on a quartz substrate(10); forming a phase shifting pattern(2) such as SOG(spin on glass) or SiO2 on a portion of the chrome patterns(1); and forming a photoresist pattern(20a) used as phase shifting layer the range of 0 -108 degrees at back-side of edge of the phase shifting pattern(2) by exposing and developing a positive photoresist(20) using as the phase shifting pattern(2) and the chrome pattern(1) as a mask.
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申请公布号 |
KR0131750(B1) |
申请公布日期 |
1998.04.14 |
申请号 |
KR19930019984 |
申请日期 |
1993.09.28 |
申请人 |
HYUNDAI ELECTRONICS IND. CO.,LTD |
发明人 |
HAM, YOUNG-MOK |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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