发明名称 Semiconductor memory device having peripheral circuit and interface circuit fabricated on bulk region out of silicon-on-insulator region for memory cells
摘要 A semiconductor dynamic random access memory device has a memory cell array fabricated on a silicon-on-insulator region and peripheral and interface circuits fabricated on a bulk region; even if the circuit components of the peripheral circuit are increased together with the memory cells, the bulk region effectively radiates the heat generated by the peripheral and interface circuits, thereby preventing the memory cells from a temperature rise.
申请公布号 US5740099(A) 申请公布日期 1998.04.14
申请号 US19960596567 申请日期 1996.02.05
申请人 NEC CORPORATION 发明人 TANIGAWA, TAKAHO
分类号 H01L21/8242;H01L27/105;H01L27/108;H01L27/12;(IPC1-7):G11C11/24 主分类号 H01L21/8242
代理机构 代理人
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