发明名称 CONDUCTIVITY MEASURING APPARATUS AND METHOD
摘要 An improved apparatus for measuring conductivity or resistivity compensates for series capacitance (Cs) and parallel capacitance (Cp). A sine-wave potential excitation (14) is applied to a reference resistance (12) and a conductivity cell (10) connected in series. The voltages across the resistance (12) and the cell (10) are sampled. To compensate for series capacitance, both sampled voltages are synchronously rectified with respect to the phase of the sampled resistance voltage. To compensate for parallel capacitance, both sampled voltages are synchronously rectified with respect to the phase of the sampled cell voltage. The rectified voltages are integrated and the cell conductivity or resistivity is calculated from the ratio of the integrated voltages.
申请公布号 CA2267281(A1) 申请公布日期 1998.04.09
申请号 CA19972267281 申请日期 1997.09.25
申请人 YSI INCORPORATED 发明人 BARNETT, BEN E.
分类号 G01N27/06;G01N33/18;G01R27/22;(IPC1-7):G01N27/06;G01R17/06 主分类号 G01N27/06
代理机构 代理人
主权项
地址