发明名称 |
Correction method leading to a uniform threshold voltage distribution for a flash eprom |
摘要 |
A method for correcting over-corrected memory cells in a flash EPROM. The flash EPROM includes an array of memory cells (25), where each of the cells includes a gate 18, a floating gate (16), a source (12), a drain (14), and a substrate (10). The method includes bulk erasing each of cells in the array of cells (step 40), which results in a plurality of over-erased cells. The over-erased cells are then corrected (step 42), which results in a plurality of over-corrected cells. The over-corrected cells are identified (step 44) and selectively erased (step 46), such that a uniform threshold voltage distribution (54) is provided for the cells in the flash EPROM.
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申请公布号 |
US5608672(A) |
申请公布日期 |
1997.03.04 |
申请号 |
US19950534141 |
申请日期 |
1995.09.26 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
TANG, YUAN;CHEN, JIAN;CHANG, CHUNG K. |
分类号 |
G11C16/34;(IPC1-7):G11C13/00 |
主分类号 |
G11C16/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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