发明名称 |
Shaking test method and system for a structure |
摘要 |
A shaking test system for testing a structure including a shaking device for shaking the structure, measuring devices mounted on the shaking device for shaking the structure, external signal input device for inputting data indicative of external force for shaking the structure, as well as other calculating arrangements. The shaking test system permits the setting of a large time interval of a shaking test by converting natural modes of vibration expressed by a second-order differential equation, namely second-order lag system of a vibration differential equation into a first-order lag system or (O)th order lag system for short period mode.
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申请公布号 |
US5737239(A) |
申请公布日期 |
1998.04.07 |
申请号 |
US19960597405 |
申请日期 |
1996.02.08 |
申请人 |
HITACHI, LTD. |
发明人 |
HORIUCHI, TOSHIHIKO;KASAI, HIROAKI;KURIHARA, MASAKI;KONNO, TAKAO |
分类号 |
G01H13/00;(IPC1-7):G01H11/00 |
主分类号 |
G01H13/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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