Fast vector loading for automatic test equipment

摘要

Fast loading of a vector test pattern in a semiconductor device tester. Fast loading is achieved through the use of delta coding of vectors in conjunction with a vector cache in the vector loading circuitry of the tester. In this way, the total amount of information transmitted during the loading operation is reduced. Hardware required to implement the method is minimized by using random access memory conventionally found in automatic test equipment for the vector cache.