发明名称 Field effect thin-film transistor and method of manufacturing the same as well as semiconductor device provided with the same
摘要 In a miniaturized complete CMOS SRAM of a TFT load type, a field effect thin-film transistor (TFT) can achieve stable reading and writing operation of a memory cell and can reduce power consumption thereof. The field effect thin-film transistor formed on an insulator includes an active layer and a gate electrode. The gate electrode is formed on a channel region of the active layer with a gate insulating film therebetween. The active layer is formed of a channel region and source/drain regions. The channel region is formed of a monocrystal silicon layer and does not includes a grain boundary. The source/drain regions is formed of a polysilicon layer. The channel region has a density of crystal defects of less than 109 pieces/cm2. The thin film transistor shows an ON current of 0.25 mu A/ mu m per channel width of 1 mu m and an OFF current of 15 fA/ mu m. The thin-film transistor can be applied to a p-channel MOS transistor serving as a load transistor in a memory cell of a CMOS type SRAM.
申请公布号 US5736438(A) 申请公布日期 1998.04.07
申请号 US19950483411 申请日期 1995.06.07
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA;RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION 发明人 NISHIMURA, HISAYUKI;SUGAHARA, KAZUYUKI;MAEDA, SHIGENOBU;IPPOSHI, TAKASHI;INOUE, YASUO;IWAMATSU, TOSHIAKI;IKEDA, MIKIO;KUNIKIYO, TATSUYA;TATEISHI, JUNJI;MINATO, TADAHARU
分类号 H01L21/20;H01L21/336;H01L21/8244;H01L27/11;H01L29/78;H01L29/786;(IPC1-7):H01L21/84 主分类号 H01L21/20
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