发明名称 |
Semiconductor component with several transistor types |
摘要 |
A semiconductor component comprises a semiconductor substrate containing three transistor types, each of which has a first conductivity type first, second or third semiconductor layer in the substrate surface, a first conductivity type first, second or third channel doping layer selectively formed in the semiconductor layer and a first, second or third control electrode formed on the semiconductor layer at a position facing the respective channel doping layer, at least one of the three control electrodes having an internal second conductivity type impurity layer with a concentration distribution in the depth direction. Also claimed is a process for producing the above semiconductor component. Further claimed is production of a semiconductor component with first and second transistor types on a single semiconductor substrate, involving (i) selectively forming a field oxide layer on the substrate surface to define first and second transistor type regions; (ii) forming an oxide layer on the two regions and over the field oxide layer; (iii) forming a conductive control electrode layer on the oxide layer; and (iv) introducing an impurity, having the same conductivity type as that of a source/drain layer, into the conductive layer at the first and/or second region.
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申请公布号 |
DE19745249(A1) |
申请公布日期 |
1998.09.10 |
申请号 |
DE19971045249 |
申请日期 |
1997.10.13 |
申请人 |
MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP |
发明人 |
UENO, SHUICHI, TOKIO/TOKYO, JP;OKUMURA, YOSHINORI, TOKIO/TOKYO, JP;MAEDA, SHIGENOBU, TOKIO/TOKYO, JP;MAEGAWA, SHIGETO, TOKIO/TOKYO, JP |
分类号 |
H01L21/8234;H01L21/8242;H01L21/8247;H01L27/088;H01L27/10;H01L27/105;H01L27/108;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L27/088;H01L21/824 |
主分类号 |
H01L21/8234 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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