发明名称 |
REMOVING METHOD OF OXIDE-FILM ON THE POLY-SILICON FILM |
摘要 |
The oxide film removing method is comprised of the step of (a) dry-etching the polysilicon film of an upper layer part using a charge storage electrode mask(4), the step of (b) wet-etching a sacrifice oxide film(3) using solution for wet-etching, then adding the surface active agent to pure water to the extent of 0.1-0.5% upon the cleaning process and performing the cleaning process to make an upper part of the polysilicon film of a lower layer part hydrophilic, suppressing generation of alien substance, and the step of (c) dry-etching the polysilicon film(2) of the lower layer part.
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申请公布号 |
KR0129658(B1) |
申请公布日期 |
1998.04.06 |
申请号 |
KR19940017159 |
申请日期 |
1994.07.15 |
申请人 |
HYUNDAI ELECTRONICS IND. CO.,LTD |
发明人 |
KIM, KYUNG-JIN;LEE, BYUNG-SUK;SONG, ILL-SUK |
分类号 |
H01L21/316;(IPC1-7):H01L21/316 |
主分类号 |
H01L21/316 |
代理机构 |
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地址 |
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