发明名称 REMOVING METHOD OF OXIDE-FILM ON THE POLY-SILICON FILM
摘要 The oxide film removing method is comprised of the step of (a) dry-etching the polysilicon film of an upper layer part using a charge storage electrode mask(4), the step of (b) wet-etching a sacrifice oxide film(3) using solution for wet-etching, then adding the surface active agent to pure water to the extent of 0.1-0.5% upon the cleaning process and performing the cleaning process to make an upper part of the polysilicon film of a lower layer part hydrophilic, suppressing generation of alien substance, and the step of (c) dry-etching the polysilicon film(2) of the lower layer part.
申请公布号 KR0129658(B1) 申请公布日期 1998.04.06
申请号 KR19940017159 申请日期 1994.07.15
申请人 HYUNDAI ELECTRONICS IND. CO.,LTD 发明人 KIM, KYUNG-JIN;LEE, BYUNG-SUK;SONG, ILL-SUK
分类号 H01L21/316;(IPC1-7):H01L21/316 主分类号 H01L21/316
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