发明名称 |
CHARGED PARTICLE BEAM EMITTING DEVICE |
摘要 |
A charged particle beam emitting device with which an image of a sample can be observed with high resolution and in a well contrasted state by securing the moving distance of the sample or installing area of a sample stage. The emitting device which scans the sample with a charged particle beam emitted from a charged article source and accquires the scanned image of the sample based on charged particles obtained by the scanning is provided with an electromagnetic lens having a magnetic pole provided between the sample and charged particle source and at least one pair of magnetic poles which are arranged below the sample and constituted to generate a magnetic field between the poles. Therefore, the image of the sample can be observed with high resolution and in a well contrasted state while the moving distance of the sample is secured within a wide acceleration voltage range.
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申请公布号 |
WO9813854(A1) |
申请公布日期 |
1998.04.02 |
申请号 |
WO1997JP03385 |
申请日期 |
1997.09.24 |
申请人 |
HITACHI, LTD.;SATO, MITSUGU;IWABUCHI, YUKO |
发明人 |
SATO, MITSUGU;IWABUCHI, YUKO |
分类号 |
H01J37/141;(IPC1-7):H01J37/141;H01J37/05 |
主分类号 |
H01J37/141 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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