发明名称 |
SEMICONDUCTOR MEMORY AND ITS MANUFACTURE |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory which is formed on a SOI substrate and has a capacitor having a large capacitance in a buried oxide film layer under a source region. SOLUTION: A buried oxide film layer 2 is formed on a semiconductor substrate 1. A MOS transistor 4 is formed on a silicon layer 3 on the buried oxide film layer 2. A trench-type capacitor 10 is formed in the buried oxide film layer 2 and right under a source region 6 of the transistor 4. The capacitor 10 comprises a conductive capacitor electrode 11a which is buried along the inner sides so that it may be directly connected to the lower part of the source region 6, a dielectric film 12 deposited inside the capacitor electrode 11a and a capacitor electrode 11b buried through the capacitor dielectric film 12. With this structure, the area of the capacitor electrode is larger than that of a conventional device and the capacitance of the capacitor is accordingly larger. |
申请公布号 |
JPH1084090(A) |
申请公布日期 |
1998.03.31 |
申请号 |
JP19960236348 |
申请日期 |
1996.09.06 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
IRIE SHIGEO;FUJIMOTO HIROMASA |
分类号 |
H01L27/108;H01L21/8242;H01L29/786 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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