发明名称 MICRO-MECHANICAL SENSOR FOR SHAPE MEASURING WITH AFM/ STM
摘要 PROBLEM TO BE SOLVED: To provide a micro-mechanical sensor for measuring shape with an atomic force microscopic microscope(AFM)/a scanning tunnel microscope(STM) which has sufficient mechanical rigidity and is appropriate for measuring an extremely deep and narrow structure having a positive flank angle. SOLUTION: The micro-mechanical sensor includes a bar 2, with a tip 1 existing for interaction with a test face to be sampled on one of its ends, while a fixing block for fixing the bar 2 exists at the other end of the bar 2. The tip 1 includes a basically conic shank 1a having a dish-shaped tip part 1b.
申请公布号 JPH1082794(A) 申请公布日期 1998.03.31
申请号 JP19970147672 申请日期 1997.06.05
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 BAYER THOMAS;GRESCHNER JOHANN DR;WEISS HELGA
分类号 G01B7/30;G01L1/14;G01N37/00;G01Q60/16;G01Q60/38;G01Q70/10;G01Q70/14 主分类号 G01B7/30
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