发明名称 |
MICRO-MECHANICAL SENSOR FOR SHAPE MEASURING WITH AFM/ STM |
摘要 |
PROBLEM TO BE SOLVED: To provide a micro-mechanical sensor for measuring shape with an atomic force microscopic microscope(AFM)/a scanning tunnel microscope(STM) which has sufficient mechanical rigidity and is appropriate for measuring an extremely deep and narrow structure having a positive flank angle. SOLUTION: The micro-mechanical sensor includes a bar 2, with a tip 1 existing for interaction with a test face to be sampled on one of its ends, while a fixing block for fixing the bar 2 exists at the other end of the bar 2. The tip 1 includes a basically conic shank 1a having a dish-shaped tip part 1b. |
申请公布号 |
JPH1082794(A) |
申请公布日期 |
1998.03.31 |
申请号 |
JP19970147672 |
申请日期 |
1997.06.05 |
申请人 |
INTERNATL BUSINESS MACH CORP <IBM> |
发明人 |
BAYER THOMAS;GRESCHNER JOHANN DR;WEISS HELGA |
分类号 |
G01B7/30;G01L1/14;G01N37/00;G01Q60/16;G01Q60/38;G01Q70/10;G01Q70/14 |
主分类号 |
G01B7/30 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|