Method of testing an integrated circuit within an automated handler environment

摘要

A method for testing of an integrated circuit of a semiconductor device which is packaged in a housing with leads projecting from the housing and contact elements, other than leads, disposed along one or more of the surfaces of the housing is disclosed. A plurality of decoupling capacitors are mounted on a printed circuit board and disposed for being temporarily connected to the contact elements during testing of the integrated circuit at an automatic handler test station, wherein a test environment is created which closely approximates a real operating environment of the integrated circuit.