发明名称 Beam exposure system having improved mask unit
摘要 In a beam exposure system, a beam is irradiated onto a mask unit, and the beam passed through the mask unit is deflected and is irradiated onto a target. The mask unit includes a polygonal hollowed holder and a plurality of masks. The holder is formed by mask mounting plates each having apertures for mounting the masks, and frames each having an aperture for passing the beam therethough.
申请公布号 US5731591(A) 申请公布日期 1998.03.24
申请号 US19970784513 申请日期 1997.01.17
申请人 NEC CORPORATION 发明人 YAMADA, YASUHISA;NOZUE, HIROSI
分类号 G03F7/20;H01J37/317;H01L21/027;(IPC1-7):H01J37/302 主分类号 G03F7/20
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