发明名称 TEST DEVICE
摘要 PROBLEM TO BE SOLVED: To conduct a series of tests to the end even when an abnormal place is detected, and to detect all abnormal places and make the tests efficient by specifying an abnormal function unit if abnormality is detected and carrying on a test in operation mode wherein the function unit is invalidated. SOLUTION: An operation mode change part 5 indicates a tested operation mode to an operation mode setting part 2 in specific effective/ineffective combination order. When a test in the operation mode normally ends, a next operation mode in the specific order is indicated to the operation mode setting part 2. If the test ends abnormally, respective effective and ineffective function units are compared between the operation mode of the abnormal end and up to the last operation mode of a normal end to detect an abnormal function unit. Then operation modes except the operation mode wherein the abnormal function unit is made effective are indicated to the operation mode setting part 2 in order.
申请公布号 JPH1078885(A) 申请公布日期 1998.03.24
申请号 JP19960235092 申请日期 1996.09.05
申请人 FUJITSU LTD 发明人 FURUKAWA KENJI;GOTO HIROSHI
分类号 G06F11/22 主分类号 G06F11/22
代理机构 代理人
主权项
地址