发明名称 Quiescent power supply current test method and apparatus for integrated circuits
摘要 An active load is connected to a power supply terminal of an electronic device such as an integrated circuit. The active load receives a reference voltage that is equal to a normal power supply voltage for application to the terminal, and a source current that is equal to a maximum quiescent power supply current that the device should sink through the terminal. A vector generator applies test signals to the device that cause it to switch between respective operating states. During each operating state, a voltage source that generates the normal power supply voltage is connected to the terminal for a length of time sufficient for the device to attain the respective operating state, and is then removed such that the device is powered only by the active load. After a sufficient length of time has elapsed for the device to achieve a quiescent state, the voltage at the terminal is sensed. If the current flowing from the active load into the terminal is less than the maximum quiescent power supply current, the sensed voltage will be equal to the reference voltage. If the current is greater than the maximum quiescent power supply current, indicating a device defect in the respective operating state, the sensed voltage will be lower than the reference voltage.
申请公布号 US5731700(A) 申请公布日期 1998.03.24
申请号 US19960668004 申请日期 1996.06.19
申请人 LSI LOGIC CORPORATION 发明人 MCDONALD, CHARLES
分类号 G01R31/30;G01R31/3193;(IPC1-7):G01R31/26 主分类号 G01R31/30
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