发明名称 High aspect ratio low resistivity lines/vias with a tungsten-germanium alloy hard cap
摘要 A structure and method for fabricating circuits which use field effect transistors (FETs), bipolar transistors, or BiCMOS (combined Bipolar/Complementary Metal Oxide Silicon structures), uses low temperature germanium gas flow to affect metals and alloys deposited in high aspect ratio structures including lines and vias. By using a germanium gas flow, germanium (Ge) will be introduced in a surface reaction which prevents voids and side seams and which also provides a passivating layer of CuGe. If a hard cap is needed for surface passivation or a wear-resistance application, the GeH4 gas followed by WF6 can be used to produce an in-situ hard cap and polish stop of WxGey, a tungsten-germanium alloy. Further, high aspect ratio vias/lines (aspect ratio of 3 or more) can be filled by utilizing low pressures and high temperatures (i.e., below 450 DEG C.) without degrading the underlying metals.
申请公布号 US5731245(A) 申请公布日期 1998.03.24
申请号 US19960738901 申请日期 1996.10.28
申请人 INTERNATIONAL BUSINESS MACHINES CORP. 发明人 JOSHI, RAJIV VASANT;TEJWANI, MANU JAMNADAS;SRIKRISHNAN, KRIS VENKATRAMAN
分类号 H01L21/28;H01L21/203;H01L21/205;H01L21/3205;H01L21/321;H01L21/768;H01L23/52;H01L23/522;H01L23/532;(IPC1-7):H01L21/302 主分类号 H01L21/28
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