发明名称 DEVICE FOR SPECTRAL MEASUREMENT ANALYSIS
摘要 PROBLEM TO BE SOLVED: To provide a spectral measurement device which uses a cell or a vessel of a comparatively small quantity of analytical sample and is comparatively simple, effective and economical. SOLUTION: This device spectrally analyzes a material of a vessel 16 by reflectance of beams 4 applied to the material through an opening part 11 of a primary mask 9. Restrictive beams 12 generated from the mask 9 are applied to a material P through a port 13 of an opaque secondary mask 10. The beams 12 exist in the whole in the port 13, and radiation relected from the material P passes through the port 13 for an analysis. The mask 10 demarcates the prescribed area in a bottom part 17 of the vessel by the port 13, and the beams 12 are applied to the material P through its port 13, and pseudo-reflection and refraction are not caused by the vessel 16 between its bottom part 17 and a side wall 18.
申请公布号 JPH1078396(A) 申请公布日期 1998.03.24
申请号 JP19970125251 申请日期 1997.05.15
申请人 PFIZER INC 发明人 PAUL K ALDRIDGE;HAMMOND STEPHEN VICTOR;AXON TONY GRAHAM
分类号 G01N21/35;G01J3/02;G01N21/13;G01N21/47;G01N21/51;(IPC1-7):G01N21/35 主分类号 G01N21/35
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