| 摘要 |
PROBLEM TO BE SOLVED: To obtain an apparatus S/N at a high recording density and a low error rate by utilizing a multilayered underlying layer in which an oriented hcp layer and an oriented bcc layer are epitaxially grown on an oriented bcc layer so that a particle size of a magnetic layer is rendered fine. SOLUTION: On a substrate 11, a multilayered underlying layer 12, a magnetic layer 13, and a protection layer 14 are sequentially formed by sputtering. The multilayered underlying layer 12 is formed so that a hexagonal closest packing structure hop layer 22 is interposed between body-centered cubic structure bcc layers 21 and 23. Herein, by using the multilayered underlying layer in which the bcc layer 21 is oriented in the (100) orientation, and the hcp layer 22 oriented in the (11, 0) orientation and further the bcc layer 23 oriented in the (100) orientation are epitaxially grown thereon, a particle size in the magnetic layer is rendered fine. In this case, by setting a product of a thickness and a residual magnetic flux density of the hcp layer 22 to be a value which corresponds to 20% of a product of a thickness and a residual magnetic flux density of the magnetic layer 13, a reduction of coercive force is prevented. Thus, an apparatus S/N at a high recording density and a low error rate are obtained, resulting in a failure interval of 300 thousand hours or more. |
