TECHNIQUE FOR INCORPORATING A BUILT-IN SELF-TEST (BIST) OF A DRAM BLOCK WITH EXISTING FUNCTIONAL TEST VECTORS FOR A MICROPROCESSOR

摘要

A processing unit having a CPU core, an integrated RAM and a test unit, which may be implemented in either a test unit, which may be implemented in either hardware or software. A built-in self-test of the RAM is designed to run concurrently with the functional vectors used to test the CPU core. Once the core tests have been activated, a control register may be written to by which will activate the built-in self-test. Thus, the BIST and core testing may overlap to minimize test time.