发明名称
摘要 First, a metal layer is deposited on a silicon film surface to form a silicide layer in an interface between the silicon film and the metal layer. Subsequently, the metal layer is all removed by etching such that silicide islands are left on the surface of the silicon film, and then the exposed silicon film surface is dry-etched by using the silicide islands as a selective mask.
申请公布号 JP2727981(B2) 申请公布日期 1998.03.18
申请号 JP19940263032 申请日期 1994.09.20
申请人 NIPPON DENKI KK 发明人 KAWANO HIDEO;SHIOTANI KEIJI;MIKAMI MASAO;SUZUKI TATSUYA;SHISHIGUCHI SEIICHI
分类号 H01L21/302;H01L21/02;H01L21/20;H01L21/3065;H01L21/822;H01L21/8242;H01L27/04;H01L27/10;H01L27/108 主分类号 H01L21/302
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