发明名称 |
Redundancy circuit |
摘要 |
A redundancy circuit for use with a semiconductor memory device is provided. The redundancy circuit includes input address buffers for storing input address bits; fuse boxes for storing repair address bits; a comparator for comparing the input address bits stored in the input address buffers with the repair address bits stored in the fuse boxes; and a redundancy enable determiner for determining whether a redundant memory cell is to be applied to the memory device according to a comparison result of the comparator.
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申请公布号 |
US2005041492(A1) |
申请公布日期 |
2005.02.24 |
申请号 |
US20040867491 |
申请日期 |
2004.06.14 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM BYOUNG-SUL |
分类号 |
G11C7/00;G11C29/00;(IPC1-7):G11C7/00 |
主分类号 |
G11C7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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