发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device in which hermetic seal is protected against deterioration due a metal brazing material creeping up a metal frame for stress relaxation. SOLUTION: The semiconductor device comprises a metal heat plate 1 having semiconductor element mounting part 1a on the upper surface thereof, a metal frame 2 bonded through a metal brazing material 10 onto the upper surface of the heat plate 1, while surrounding the semiconductor element mounting part 1a, a ceramic frame 3 mounted on the upper end of the metal frame 2 and bonded thereto through the metal brazing material 10, a semiconductor element 4 bonded through the metal brazing material 10 to the semiconductor element mounting part 1a on the heat plate 1 surrounded by the ceramic frame 3, and a cover 6 being applied to the opening at the upper end of the ceramic frame 3 bonded with the semiconductor element 4, thus hermetically sealing the space for containing the semiconductor element 4. A receiving part 7a of brazing material 10 is formed on the heat plate 1 at a position lower than the bonding face of the metal frame 2 and the heat plate 1, so that the brazing material 10 flows into the receiving part 7a.
申请公布号 JPH1074853(A) 申请公布日期 1998.03.17
申请号 JP19960231169 申请日期 1996.08.30
申请人 NEC CORP 发明人 MURAI NOBUHIRO
分类号 H01L23/02;H01L23/04;(IPC1-7):H01L23/02 主分类号 H01L23/02
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