| 摘要 |
PROBLEM TO BE SOLVED: To measure an entire spectral radiation flux emitted from fluorescence of a phosphor sample of even a thin film or a film not so thick, by setting fluorescence-measuring integrating spheres at the side where an excitation light is projected and at the opposite side. SOLUTION: A phosphor sample 10 is let to emit light by an excitation light 2 from a light source 1. At this time, a spectral radiation illuminance EA (λ) when only an integrating sphere 4 at the side where the excitation light is projected is set is measured by a measuring device 5. A spectral radiation illuminance EB (λ) when only an integrating sphere 9 at the side opposite to the projection side is mounted is measured by a measuring device 8. A spectral radiation flux PA (λ) of fluorescence at the projection side and a spectral radiation flux PB (λ) at the opposite side are obtained according to equations PA (λ)=EA (λ).QA (λ) and PB (λ)=EB (λ).QB (λ). In the equations, the QA (λ) is a spectral efficiency of the integrating sphere 4 and QB (λ) is a spectral efficiency of the integrating sphere 9. Accordingly, the spectral radiation flux can be measured without omission.
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