| 摘要 |
PROBLEM TO BE SOLVED: To obtain an evaluation method in which a half-wave plate can be evaluated by a simple device, i.e., only by a polarizer, as compared with conventional techniques and in which the half-wave plate can be measured with high accuracy by increasing the number of measuring points. SOLUTION: In this method, linearly polarized light which is vibrated to a direction tilted byθwith reference to the optical axis of a half-wave plate 3 to be evaluated is incident on the half-wave plate 3, light which is transmitted through the half-wave plate 3 is extinguished by a polarizer 4, a quantity of light which is leaked from the polarizer 4 is measured by variousθvalues, and theθdependence of the ratio (the extinction ratio of the half-wave plate 3) of a quantity of light transmitted through the polarizer to the quantity of incident light is found. In addition, theθdependence is compared with theθdependence of the computed extinction ratio of the half-wave plate 3 having a retardation error in a constant amount, and the retardation error of the half- wave plate 3 to be evaluated.
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